iMAPS New England Chapter Meeting
& Technologists Open Networking Meeting
March 06, 2018Boxboro Regency Hotel & Conference Center
242 Adams Place, Boxborough, Massachusetts
and Counterfeit Detection Testing of Microelectronic Components”
Joe Favata, Ph.D. Candidate & Laboratory Manager, REFINE Laboratory, University of Connecticut, Storrs, CT
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Summary: Existing measures to assure the quality and authenticity of microelectronic hardware components are predominately destructive involving bulk package removal and invasive mechanical testing by manufacturers and consumers prior to integration or after failure. So, tested circuits cannot be both assured and integrated as the process renders them useless. Plus, destructive tests are expensive, requiring specialized apparatus, significant time, trained users, and subject matter experts to interpret results. Our Speaker presents a non-destructive alternative involving data acquisition by 3-D X-ray tomography, file size reduction/conversion to a CAD-editable geometry, and finite element analysis. Speaker: Joe Favata is a Ph.D. Candidate and Manager of the REFINE Laboratory at the University of Connecticut. His research pertains to multi-modality, cross-correlative microscopy and finite element modeling on the micro- and nano-scales. He studied Mechanical Engineering and Physics at Manhattan College, earning a B.S. in 2016 and, in 2017, his M.S. in Mechanical Engineering from UConn. |
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SCHEDULE (times approximate): |
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| 5:30 PM | Registration, Socializing, Networking & Cash Bar |
| 6:30 PM | Dinner (Chicken Marsala or Baked Haddock) |
| 7:30 PM | Technical Presentation |
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The "Member" registration fee will apply to anyone that belongs to a Technical-Professional Society. |